Recent Conferences:

Microscopy & Microanalysis

Phoenix, Arizona
July 29-August 2, 2012
M&M 2012 Information

EIPBN 2012

Visit us at booth #117!
Waikoloa, Hawaii
May 29-June 1, 2012
EIPBN 2012 Information

May 31, 2012 - Session 6B, Ebeam II - 4:00pm:
Cold Field, Thermal-Field, and Schottky Emission from HfC(310) Sources, William Mackie, Josh Lovell and Gerald Magera, Applied Physics Technologies
View Abstract

IVEC/IVESC 2012

Monterey, California
April 24-26, 2012
IVEC/IVESC 2012 Information

APTech at IVEC/IVESC 2012:

Hafnium Carbide CFE, TFE, and Schottky Electron Sources
Oral Presentation given by Dr. William Mackie
View Abstract

Hafnium Carbide Thermal Sources in CO and CO2 Environments
Poster Presentation given by Josh Lovell
View Abstract

AVS 2011

Nashville, Tennessee
October 30-November 4, 2011
Booth #312

AVS 2011 Information

Microscopy & Microanalysis

Nashville, Tennessee
August 7-11, 2011

Microscopy & Microanalysis Information

EIPBN 2011

Las Vegas, NV
May 31, 2011 - June 3, 2011

APTech EIPBN 2011 Conference Paper (submitted draft)

EIPBN Information